Structure-Property Relation of SrTiO3/LaAlO3 Interfaces

被引：268

作者：

Huijben, Mark ^{[1
]}

Brinkman, Alexander ^{[1
]}

Koster, Gertjan ^{[1
]}

Rijnders, Guus ^{[1
]}

Hilgenkamp, Hans ^{[1
]}

Blank, Dave H. A. ^{[1
]}

机构：

[1] Univ Twente, MESA Inst Nanotechnol, NL-7500 AE Enschede, Netherlands

来源：

ADVANCED MATERIALS | 2009年 / 21卷 / 17期

关键词：

PULSED-LASER DEPOSITION; LAYER-BY-LAYER; THIN-FILM; PHASE-TRANSITION; LAALO3/SRTIO3; INTERFACE; ELECTRONIC-STRUCTURE; SURFACE-MORPHOLOGY; POWDER DIFFRACTION; SRTIO3; HOMOEPITAXY; OXIDE INTERFACES;

D O I：

10.1002/adma.200801448

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A large variety of transport properties have been observed at the interface between the insulating oxides SrTiO3 and LaAlO3 such as insulation, 2D interface metallicity, 3D bulk metallicity, magnetic scattering, and super- conductivity. The relation between the structure and the properties of the SrTiO3/LaAlO3 interface can be explained in a meaningful way by taking into account the relative contribution of three structural aspects: oxygen vacancies, structural deformations (including cation disorder), and electronic interface reconstruction. The emerging phase diagram is much richer than for related bulk oxides due to the occurrence of interface electronic reconstruction. The observation of this interface phenomenon is a display of recent advances in thin film deposition and characterization techniques, and provides an extension to the range of exceptional electronic properties of complex oxides.

引用

页码：1665 / 1677

页数：13

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