Application of spectromicroscopy tools to explore local origins of sensor activity in quasi-1D oxide nanostructures

被引:9
作者
Kolmakov, A. [1 ]
Lanke, U.
Karam, R.
Shin, J.
Jesse, S.
Kalinin, S. V.
机构
[1] So Illinois Univ, Dept Phys, Carbondale, IL 62901 USA
[2] Univ Saskatchewan, Canadian Light Source, Saskatoon, SK S7N 5C9, Canada
[3] Univ Saskatchewan, Dept Chem, Saskatoon, SK S7N 5C9, Canada
[4] Invenios Inc, Santa Barbara, CA 93117 USA
[5] Oak Ridge Natl Lab, Condensed Matter Sci Div, Oak Ridge, TN 37831 USA
关键词
D O I
10.1088/0957-4484/17/16/003
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have tested a range of imaging and spectroscopic techniques to address their ability to locally explore the interplay between surface reactivity and transport properties of the metal oxide nanostructure wired as a chemiresistor and chemi-FET. In particular, we used scanning surface potential microscopy ( SSPM) to monitor the spatial and temporal particularities of the dc potential distributions in an operating device. We also successfully implemented synchrotron radiation- based photoelectron emission microscopy ( PEEM) to explore submicron lateral compositional and electronic ( work function) inhomogeneity on the surface of an individual nanowire sensor. These results open new avenues to visualize and spectroscopically address the chemical phenomena on an individual quasi-1D nanostructure both in real time and at nano- and mesoscopic level.
引用
收藏
页码:4014 / 4018
页数:5
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