Anisotropic magnetoresistance of (0 0 h), (0 h h) and (h h h) La2/3Sr1/3MnO3 thin films on (001) Si substrates

被引:25
作者
Bibes, M
Martínez, B
Fontcuberta, J [1 ]
Trtik, V
Ferrater, C
Sánchez, F
Varela, M
Hiergeist, R
Steenbeck, K
机构
[1] CSIC, Inst Ciencia Mat Barcelona, Bellaterra 08193, Catalunya, Spain
[2] Univ Barcelona, Dept Fis Aplicada & Opt, E-08028 Barcelona, Catalunya, Spain
[3] Inst Phys Hochtechnol eV Jena, D-07745 Jena, Germany
关键词
thin films; anisotropic magnetoresistance; microstructure;
D O I
10.1016/S0304-8853(99)00735-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The epitaxial growth of magnetoresistive La2/3Sr1/3MnO3 thin films with different orientations on (0 0 1) Si substrates has been successfully achieved by a suitable choice of the buffer heterostructure. The out-of-plane and in-plane microstructure has been carefully analysed and related to the magnetocrystalline anisotropy. The dependence of the magnetoresistance (MR) as a function of the angle between the current and the applied field has been explored in a wide field range. At high field the magnetisation is saturated whatever the direction of the field and we observe the intrinsic anisotropic magnetoresistance (AMR) effect having a uniaxial anisotropy while at low field the magnetocrystalline anisotropy induces higher-order angle dependence of the magnetoresistance. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:206 / 211
页数:6
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