Polycrystalline MnZn ferrite films prepared by pulsed laser deposition

Pulsed laser deposition of polycrystalline MnZn ferrite films with various stoichiometries onto high silicon content glass substrates at temperatures of 800 degrees C-850 degrees C is reported. Scanning electron microscopy and energy-dispersive X-ray analysis indicate that the films are ablated as stoichiometric phases. This is consistent with the film structure, as determined from the X-ray diffraction patterns, which exhibit the single phase patterns of the bulk materials, with slightly modified line intensity ratios which originate from strain-induced texture, VSM measurements show coercive field values which are larger than those found for the targets, in direct relation to the crystallite shape anisotropy originating in the film microstructure, while saturation magnetization values are comparable with the bulk.