CLUSTER TOF-SIMS IMAGING AS A TOOL FOR MICROMETRIC HISTOLOGY OF LIPIDS IN TISSUE

被引：54

作者：

Bich, Claudia ^{[1
]}

Touboul, David ^{[1
]}

Brunelle, Alain ^{[1
]}

机构：

[1] CNRS, Ctr Rech Gif, Inst Chim Subst Nat, F-91198 Gif Sur Yvette, France

来源：

MASS SPECTROMETRY REVIEWS | 2014年 / 33卷 / 06期

关键词：

mass spectrometry imaging; TOF-SIMS; clusters; lipids; ION MASS-SPECTROMETRY; BRAIN-TISSUE; MALDI-MS; BEAMS; SECTION; DISEASE; SURFACE; SYSTEM; FILMS; MICROSPECTROSCOPIES;

D O I：

10.1002/mas.21399

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Recent developments in instrumentation, ion beams or analyzers, for cluster time-of-flight secondary ion mass spectrometry (TOF-SIMS) imaging are described here. The methods which are employed to increase the sensitivity or to perform three-dimensional analyses in the organic materials are also illustrated. This review shows the improvements made for lipid imaging by cluster TOF-SIMS in various types of material and applications, and gives reasons for the expansion of its utilization. (c) 2013 Wiley Periodicals, Inc. Mass Spec Rev 33: 442-451, 2014.

引用

页码：442 / 451

页数：10

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