Photoionization of highly charged ions using an ECR ion source and undulator radiation

被引：58

作者：

Bizau, JM

Esteva, JM

Cubaynes, D

Wuilleumier, FJ

Blancard, C

La Fontaine, AC

Couillaud, C

Lachkar, J

Marmoret, R

Rémond, C

Bruneau, J

Hitz, D

Ludwig, P

Delaunay, M

机构：

[1] Univ Paris Sud, UMR CNRS 8624, Lab Spect Atom & Ion, F-91405 Orsay, France

[2] CEA, DIF, DPTA, F-91680 Bruyeres Le Chatel, France

[3] CEA, Dept Rech Fondamentale Mat Condensee, SI2A, F-38054 Grenoble, France

来源：

PHYSICAL REVIEW LETTERS | 2000年 / 84卷 / 03期

关键词：

D O I：

10.1103/PhysRevLett.84.435

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Photoionization of Xe4+ to Xe7+ ions was studied by combining an electron cyclotron resonance ion source with synchrotron radiation. Multiconfiguration Dirac-Fock calculations were performed to interpret the data. Many autoionization lines were measured and identified, resulting from excitation of a 4d electron into nf and np orbitals followed by Auger decay of the excited states. Continuum photoionization is negligible for the higher members of the isonuclear series.

引用

页码：435 / 438

页数：4

共 25 条

[1] First angle-resolved photoelectron measurements following inner-shell resonant excitation in a singly charged ion [J].