XPS analysis of the lithium intercalation in amorphous tungsten oxysulfide thin films

被引：31

作者：

Martin, I

Vinatier, P

Levasseur, A

Dupin, JC

Gonbeau, D

机构：

[1] CNRS, Inst Chim Mat Condensee, F-33402 Talence, France

[2] Ecole Natl Super Chim & Phys Bordeaux, F-33402 Talence, France

[3] Univ Pau & Pays Adour, UMR 5624, Lab Physicochim Mol, F-64000 Pau, France

来源：

JOURNAL OF POWER SOURCES | 1999年 / 81卷

关键词：

thin films; XPS analysis; lithium batteries; RF magnetron sputtering; transition element oxysulfide;

D O I：

10.1016/S0378-7753(99)00129-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Amorphous thin films of tungsten oxysulfide have been prepared by radio frequency (RF) magnetron sputtering. The composition of thin films is varied by changing the pressure of the reactive gas (O-2) and discharge gas (Ar + O-2) in the sputtering chamber. The X-ray photoelectron spectroscopy (XPS) studies of the thin films have shown three different types of environment for tungsten atoms: W6+ surrounded by oxygen O2-, W4+ surrounded by sulphur S2- and W5+ in a mixed oxygen-sulphur environment consisting of O2-, S2- and S-2(2-) pairs. The electrochemical characterisation of the film was performed in the Li/LiPF6-EC-DMC/WOySz cell. The XPS during intercalation evidences the role of W6+ and S-2(2-) in the redox process. (C) 1998 Elsevier Science S.A. AU rights reserved.

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页码：306 / 311

页数：6

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