Effects of doping on ferroelectric properties and leakage current behavior of KNN-LT-LS thin films on SrTiO3 substrate

被引:52
作者
Abazari, M. [1 ]
Safari, A. [1 ]
机构
[1] Rutgers State Univ, Dept Mat Sci & Engn, Glenn Howatt Electroceram Labs, Piscataway, NJ 08854 USA
关键词
PULSED-LASER DEPOSITION; PIEZOELECTRIC PROPERTIES; CERAMICS; GROWTH;
D O I
10.1063/1.3120922
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report the effects of Ba, Ti, and Mn dopants on ferroelectric polarization and leakage current of (K0.44Na0.52Li0.04)(Nb0.84Ta0.1Sb0.06)O-3 (KNN-LT-LS) thin films deposited by pulsed laser deposition. It is shown that donor dopants such as Ba2+, which increased the resistivity in bulk KNN-LT-LS, had an opposite effect in the thin film. Ti4+ as an acceptor B-site dopant reduces the leakage current by an order of magnitude, while the polarization values showed a slight degradation. Mn4+, however, was found to effectively suppress the leakage current by over two orders of magnitude while enhancing the polarization, with 15 and 23 mu C/cm(2) remanent and saturated polarization, whose values are similar to 70% and 82% of the reported values for bulk composition. This phenomenon has been associated with the dual effect of Mn4+ in KNN-LT-LS thin film, by substituting both A- and B-site cations. A detailed description on how each dopant affects the concentrations of vacancies in the lattice is presented. Mn-doped KNN-LT-LS thin films are shown to be a promising candidate for lead-free thin films and applications. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3120922]
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页数:5
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