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Aluminum thickness dependence of spatial profile in niobium-based superconducting tunnel junctions

被引：13
作者：
Ukibe, M
Ikeuchi, T
Zama, T
Ohkubo, M
机构：
[1] AIST, Tsukuba, Ibaraki 3058568, Japan
[2] Meiji Univ, Kawasaki, Kanagawa 2148571, Japan
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2004年 / 520卷 / 1-3期
关键词：
X-ray spectroscopy; superconducting tunnel junctions; spatial profile; synchrotron radiation; X-ray; lift-off;
D O I：
10.1016/j.nima.2003.11.339
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Spatial profiles of low-temperature detectors can be measured with Low-Temperature Scanning Synchrotron Microscopy directly. The. dependence of the spatial profiles on the bias current, the magnetic field strength, and the size of junctions have been already studied in previous reports. In this study, we fabricated Nb-based junctions having At layers of different thicknesses, which are located at the both sides of the tunneling barrier, by using a lift-off technique. It has been found that the spatial uniformity is improved by increasing the At thickness. Therefore, it is demonstrated that the At layers play a important role more than quasiparticle trapping. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码：260 / 262
页数：3
相关论文
共 9 条
[1]   Quasiparticle diffusion, edge losses, and back-tunneling in superconducting tunnel junctions under x-ray irradiation [J].
Cristiano, R ;
Esposito, E ;
Frunzio, L ;
Nappi, C ;
Ammendola, G ;
Parlato, L ;
Pepe, G ;
Kraus, H ;
Walko, P .
JOURNAL OF APPLIED PHYSICS, 1999, 86 (08) :4580-4587
[2]  
DERHARTOG R, 1999, IEEE T APPL SUPERCON, V9, P449
[3]   High-resolution X-ray detectors with high-speed SQUID readout of superconducting tunnel junctions [J].
Frank, M ;
Mears, CA ;
Labov, SE ;
Azgui, F ;
Lindeman, MA ;
Hiller, LJ ;
Netel, H ;
Barfknecht, A .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1996, 370 (01) :41-43
[4]  
Kozorezov AG, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.094510
[5]  
OHKUBO M, 2003, LTD10
[6]   Experimental imaging diagnosis of superconducting tunnel junction x-ray detectors by low-temperature scanning synchrotron microscope [J].
Pressler, H ;
Ohkubo, M ;
Koike, M ;
Ukibe, M ;
Zama, T ;
Nakamura, T ;
Katagiri, M .
APPLIED PHYSICS LETTERS, 2000, 77 (24) :4055-4057
[7]  
Pressler H, 2002, AIP CONF PROC, V605, P19, DOI 10.1063/1.1457585
[8]   Spatially resolved study of superconducting tunnel junctions x-ray detectors by low temperature scanning synchrotron microscopy [J].
Pressler, H ;
Ohkubo, M ;
Koike, M ;
Zama, T ;
Fukuda, D ;
Kobayashi, N .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2001, 11 (01) :696-699
[9]   Inhomogeneous response of superconducting tunnel junctions with a killed electrode for X-ray spectroscopy [J].
vandenBerg, ML ;
Bruijn, MP ;
Gomez, J ;
Kiewiet, FB ;
deKorte, PAJ ;
vanLieshout, HL ;
Luiten, OJ ;
Martin, J ;
leGrand, JB ;
Schroeder, T ;
Huebener, RP .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1997, 7 (02) :3363-3366
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