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Local Electrode Atom Probes

被引：124
作者：
Kelly, TF
Larson, DJ
机构：
[1] Univ Wisconsin, Dept Mat Sci & Engn, Madison, WI 53706 USA
[2] Oak Ridge Natl Lab, Div Met & Ceram, Oak Ridge, TN 37831 USA
来源：
MATERIALS CHARACTERIZATION | 2000年 / 44卷 / 1-2期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1016/S1044-5803(99)00055-8
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The historical developments leading to the advent of Local Electrode Atom Probes (LEAP) are reviewed. An assessment of the state of the art is made, and the major advantages of LEAPs over conventional atom probes are described. The best implementations of these concepts and the remaining challenges for realization of LEAP's potential are also described. It is concluded that LEAPs should be an important tool for materials characterization at the atomic scale. Modern materials-dependent industries as diverse as steel and microelectronics should benefit from this technology. (C) Elsevier Science Inc., 2000. All rights reserved.
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收藏
页码：59 / 85
页数：27
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