Tritium depth profiling in carbon by accelerator mass spectrometry

被引:16
作者
Friedrich, M
Sun, G
Grotschel, R
Behrisch, R
GarciaRosales, C
Roberts, ML
机构
[1] EURATOM,MAX PLANCK INST PLASMAPHYS,D-85749 GARCHING,GERMANY
[2] LAWRENCE LIVERMORE NATL LAB,LIVERMORE,CA 94551
关键词
D O I
10.1016/S0168-583X(96)00404-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A facility for tritium depth profiling measurements by AMS has been installed at the Rossendorf 3 MV Tandetron. Depth profiles are obtained by mechanical scanning of the sputter sample inside a commercial Cs sputter ion source. The deuterium profiles are obtained simultaneously using the injection magnet for mass separation. First results of measurements at carbon tiles from the Garching DD fusion experiment ASDEX-upgrade are presented. The influence of different parameters on the measured profiles is discussed.
引用
收藏
页码:410 / 413
页数:4
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