Observation of enhanced defect emission and excitonic quenching from spherically indented ZnO

被引：36

作者：

Coleman, V. A. ^{[2
]}

Bradby, J. E.

Jagadish, C.

Phillips, M. R.

机构：

[1] Univ Technol Sydney, Microstruct Anal Unit, Broadway, NSW 2007, Australia

[2] Australian Natl Univ, Res Sch Phys Sci & Engn, Dept Elect Mat Engn, Canberra, ACT 0200, Australia

来源：

APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 08期

基金：

澳大利亚研究理事会;

关键词：

SINGLE-CRYSTAL ZNO; ZINC-OXIDE; CATHODOLUMINESCENCE; DEVICES;

D O I：

10.1063/1.2338552

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The influence of spherical nanoindentation on the band edge and deep level emission of single crystal c-axis ZnO has been studied by cathodoluminescence (CL) spectroscopy and monochromatic imaging. Excitonic emission is quenched at the indent site and defect emission in the range of 450-720 nm is enhanced. Analysis of CL monochromatic images and spectra suggests that at least two different defect states are responsible for the broad defect emission band. Additionally, the indents result in a strong crystallographic dependence of the defect emission, producing a rosette feature with [11 (2) over bar0] [2 (1) over bar(1) over bar0], and [1 (2) over bar 10] orientations that reflect the star-shaped luminescence quenching observed at the excitonic peak (390 nm).

引用

页数：3

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