Evaluation of Controlled-Drift Detectors in X-Ray Spectroscopic Imaging Applications

被引:7
作者
Castoldi, Andrea [1 ,2 ]
Guazzoni, Chiara [1 ,2 ]
Ozkan, Cigdem [1 ,2 ,3 ]
Vedani, Giorgio [1 ,4 ]
Hartmann, Robert [5 ]
Bjeoumikhov, Aniouar [6 ]
机构
[1] Politecn Milan, Dip Elettron & Informaz, I-20133 Milan, Italy
[2] INFN, Sez Milano, I-20133 Milan, Italy
[3] Univ Milan, Dip Fis, I-20133 Milan, Italy
[4] PNSensor GmbH, D-80803 Munich, Germany
[5] Max Planck Inst Halbleiterlabor, D-81739 Munich, Germany
[6] IFG GmbH, Berlin, Germany
关键词
controlled-drift detectors; silicon drift detectors; X-ray imaging; X-ray spectroscopy; XRF; absorption contrast; diffraction enhanced imaging; elemental mapping; POSITION; ENERGY;
D O I
10.1017/S1431927609090291
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A detector that looks promising for advanced imaging modalities-such as X-ray absorption contrast imaging, X-ray fluorescence imaging, and diffraction-enhanced imaging-is the controlled-drift detector (CDD). The CDD is a novel two-dimensional X-ray imager with energy resolving capability of spectroscopic quality It is built on a fully depleted silicon wafer and features fast readout while being operated at or near room temperature. The use of CDDs in the aforementioned applications allows translating these techniques from synchrotron-based experiments to laboratory-size experiments using polychromatic X-ray generators. We have built a dedicated and versatile detection module based on a 36 mm(2) CDD chip featuring pixels of 180 x 180 mu m(2), and we evaluated the system performance in different X-ray imaging applications both with synchrotron-based experiments and in the laboratory environment.
引用
收藏
页码:231 / 236
页数:6
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