共 18 条
Evaluation of Controlled-Drift Detectors in X-Ray Spectroscopic Imaging Applications
被引:7
作者:
Castoldi, Andrea
[1
,2
]
Guazzoni, Chiara
[1
,2
]
Ozkan, Cigdem
[1
,2
,3
]
Vedani, Giorgio
[1
,4
]
Hartmann, Robert
[5
]
Bjeoumikhov, Aniouar
[6
]
机构:
[1] Politecn Milan, Dip Elettron & Informaz, I-20133 Milan, Italy
[2] INFN, Sez Milano, I-20133 Milan, Italy
[3] Univ Milan, Dip Fis, I-20133 Milan, Italy
[4] PNSensor GmbH, D-80803 Munich, Germany
[5] Max Planck Inst Halbleiterlabor, D-81739 Munich, Germany
[6] IFG GmbH, Berlin, Germany
关键词:
controlled-drift detectors;
silicon drift detectors;
X-ray imaging;
X-ray spectroscopy;
XRF;
absorption contrast;
diffraction enhanced imaging;
elemental mapping;
POSITION;
ENERGY;
D O I:
10.1017/S1431927609090291
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
A detector that looks promising for advanced imaging modalities-such as X-ray absorption contrast imaging, X-ray fluorescence imaging, and diffraction-enhanced imaging-is the controlled-drift detector (CDD). The CDD is a novel two-dimensional X-ray imager with energy resolving capability of spectroscopic quality It is built on a fully depleted silicon wafer and features fast readout while being operated at or near room temperature. The use of CDDs in the aforementioned applications allows translating these techniques from synchrotron-based experiments to laboratory-size experiments using polychromatic X-ray generators. We have built a dedicated and versatile detection module based on a 36 mm(2) CDD chip featuring pixels of 180 x 180 mu m(2), and we evaluated the system performance in different X-ray imaging applications both with synchrotron-based experiments and in the laboratory environment.
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页码:231 / 236
页数:6
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