Contrast mechanism for visualization of ferroelectric domains with scanning force microscopy

被引：8

作者：

Jungk, T. ^{[1
]}

Soergel, E. ^{[1
]}

机构：

[1] Univ Bonn, Inst Phys, D-53115 Bonn, Germany

来源：

FERROELECTRICS | 2006年 / 334卷

关键词：

scanning force microscopy; domains visualization; LiNbO(3);

D O I：

10.1080/00150190600689654

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Scanning force microscopy is an ideal technique for non-destructive investigation of ferroelectric domains. Application of such domains for efficient optical frequency conversion andfor ultrahigh-density data storage requires mu m to nm-sized domain structures. Thus the high lateral resolution offered by scanning force microscopy is highly desired. However the mechanism causing the domain contrast is not yet fully understood. Investigations of periodically-poled lithium niobate samples with conductive as well as insulating surface layers indicate that the observed domain contrast is not solely due to the electromechanical piezoresponse.

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页码：29 / 34

页数：6

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