The special features of diffraction from particles in the nanometer size range are discussed and the problem of structure determination is considered. A direct method of structure analysis, known as Debye Function Analysis, is presented and evaluated. The method is capable of obtaining information about both the size and structure of domains in a sample, and can identify noncrystalline structures. Numerical simulations of observations are used to investigate the limitations of the technique, and also provide a general method for quantifying uncertainties in parameters estimated by Debye Function Analysis. (C) 2000 American Institute of Physics. [S0021-8979(00)08503-0].
机构:Department of Materials Science and Engineering, The Robert R. McCormick School of Engineering and Applied Science, The Technological Institute, Evanston
机构:Department of Materials Science and Engineering, The Robert R. McCormick School of Engineering and Applied Science, The Technological Institute, Evanston