Probing electrical properties of molecule-controlled or plasma-nitrided GaAs surfaces: Two different tools for modifying the electrical characteristics of metal/GaAs diodes

被引:4
作者
Ambrico, M.
Losurdo, M.
Capezzuto, P.
Bruno, G.
Ligonzo, T.
Haick, H.
机构
[1] CNR, Ist Medodol Inorgan & Plasmi, I-70126 Bari, Italy
[2] Univ Bari, Dipartimento Interateneo Fis, I-70126 Bari, Italy
[3] CNISM, Unita Bari, I-70126 Bari, Italy
[4] Weizmann Inst Sci, Dept Mat & Interfaces, IL-76100 Rehovot, Israel
[5] CALTECH, Div Chem & Chem Engn, Pasadena, CA 91106 USA
关键词
GaAs; GaN; plasma; monolayer; interface; diode; barrier height;
D O I
10.1016/j.apsusc.2006.03.057
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
This work shows how partial monolayer of organic molecules or radio-frequency remote plasma surface treatment affects the electrical transport across Au/n-GaAs junctions. In the first case, a series of molecules with systematically varying dipole moment were adsorbed on n-GaAs surfaces, whereas in the second case GaN ultra-thin layers with different thickness were formed by N-2-H-2 GaAs plasma nitridation, prior to contact deposition. The characteristics of electrical charge transport across the resulting interfaces were studied by current-voltage (I-V), internal photoemission (IPE), and capacitance-voltage (C-V) techniques. In this way, we find that the simplest description for the experimentally observed data is in terms of two different barrier heights, rather than one barrier height, at the interface. The first could be identified with areas free of modified GaAs, and the second with areas controlled by electrostatic effects of adjacent dipolar domains, which affects also semiconductor regions under the film's pinholes. (c) 2006 Published by Elsevier B.V.
引用
收藏
页码:7636 / 7641
页数:6
相关论文
共 39 条
[1]   Au/GaAs(100) interface Schottky barrier modification by a silicon nitride intralayer [J].
Almeida, J ;
Coluzza, C ;
dellOrto, T ;
Margaritondo, G ;
Terrasi, A ;
Ivanco, J .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (01) :292-296
[2]  
AMBRICO M, 2005, SOLID STATE ELECT, V49, P413
[3]  
[Anonymous], 1967, INORGANIC CHEM
[4]   Real-time spectroscopic ellipsometry for III-V surface modifications - Hydrogen passivation, oxidation and nitridation by plasma processing [J].
Bruno, G ;
Capezzuto, P ;
Losurdo, M .
VACUUM, 2000, 57 (02) :189-199
[5]   REMOTE INDUCTIVE EFFECTS EVALUATED BY X-RAY PHOTOELECTRON-SPECTROSCOPY (ESCA) [J].
CARVER, JC ;
GRAY, RC ;
HERCULES, DM .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1974, 96 (22) :6851-6856
[6]   Molecular control over semiconductor surface electronic properties: Dicarboxylic acids on CdTe, CdSe, GaAs, and InP [J].
Cohen, R ;
Kronik, L ;
Shanzer, A ;
Cahen, D ;
Liu, A ;
Rosenwaks, Y ;
Lorenz, JK ;
Ellis, AB .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1999, 121 (45) :10545-10553
[7]   Controlling electronic properties of CdTe by adsorption of dicarboxylic acid derivatives: Relating molecular parameters to band bending and electron affinity changes [J].
Cohen, R ;
Bastide, S ;
Cahen, D ;
Libman, J ;
Shanzer, A ;
Rosenwaks, Y .
ADVANCED MATERIALS, 1997, 9 (09) :746-749
[8]   SURFACE STATES AND BARRIER HEIGHT OF METAL-SEMICONDUCTOR SYSTEMS [J].
COWLEY, AM ;
SZE, SM .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (10) :3212-&
[9]   The analysis of photoelectric sensitivity curves for clean metals at various temperatures [J].
Fowler, RH .
PHYSICAL REVIEW, 1931, 38 (01) :45-56
[10]   Pd versus Au as evaporated metal contacts to molecules [J].
Haick, H ;
Ghabboun, J ;
Cahen, D .
APPLIED PHYSICS LETTERS, 2005, 86 (04) :042113-1