Hybrid scanning near-field optica/tunneling microscopy with indium-tin-oxide/Au coated optical fiber probe

被引:6
作者
Nakajima, K [1 ]
Jacobsen, V
Yamasaki, Y
Noh, J
Fujita, D
Hara, M
机构
[1] RIKEN, Inst Phys & Chem Res, Frontier Res Syst, Local Spatio Temporal Funct Lab, Wako, Saitama 3510198, Japan
[2] RIKEN, Inst Phys & Chem Res, Supramol Sci Lab, Wako, Saitama 3510198, Japan
[3] Natl Inst Mat Sci, Nanomat Lab, Nanophys Res Grp, Tsukuba, Ibaraki 3050047, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2002年 / 41卷 / 7B期
关键词
scanning near-field optical microscope; scanning tunneling microscope; aperture; indium-tin-oxide; nanoparticle;
D O I
10.1143/JJAP.41.4956
中图分类号
O59 [应用物理学];
学科分类号
摘要
As widely known, the spatial resolution of a scanning near-field optical microscope (SNOM) is strongly limited by its aperture size (50-200nm). However, as reported by the authors [Jpn. J. Appl. Phys. 38 (1999) 3949], a hybrid system of a SNOM with a scanning tunneling microscope (STM) using a "doubly metal-coated optical fiber probe" could be used to overcome this limitation, resulting in a high-resolution feature (lambda/50 similar or equal to 10 nm). However, the throughput of such a probe was extremely low because of the metal coating on the aperture. In this study, we developed a novel probe to overcome this disadvantage, where the metal coating on the aperture was replaced with an indium-tin-oxide (ITO) coating. The performance of this probe was evaluated by examining isolated CdSe nanoparticles on an ITO substrate. The fluorescence front each nanoparticle was observed as a bright spot with the full-width at half-maximum of about 20 nm, indicating high spatial resolution beyond the aperture size without sacrificing single-molecular-level high sensitivity.
引用
收藏
页码:4956 / 4960
页数:5
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