A microfabricated tip for simultaneous acquisition of sample topography and high-frequency magnetic field

被引：14

作者：

Agrawal, V ^{[1
]}

Neuzil, P ^{[1
]}

vanderWeide, DW ^{[1
]}

机构：

[1] STANFORD UNIV, DEPT ELECT ENGN, STANFORD, CA 94305 USA

来源：

APPLIED PHYSICS LETTERS | 1997年 / 71卷 / 16期

关键词：

D O I：

10.1063/1.120073

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report a combined mu m-level topography and high-frequency magnetic field probe, a 6 mu m loop defined on a scanning-force microscope cantilever. Since it functions as a near-zone antenna, it can be used with any suitable detector, and can probe both active and passive samples. We demonstrate its performance by scanning a coplanar waveguide sample at 10 GHz using a microwave network analyzer. With this instrument, the device noise at this frequency is similar to 2 mu Phi(0)/Hz(1/2) at T=300 K, comparable to that found for a superconducting quantum interference device (SQUID) at DC. Unlike the SQUID, however, the thermally limited minimum-detectable field of this system scales with frequency. (C) 1997 American Institute of Physics.

引用

页码：2343 / 2345

页数：3

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