Localized picosecond resolution with a near-field microwave/scanning-force microscope

被引：31

作者：

vanderWeide, DW

机构：

[1] Dept. of Elec. and Comp. Engineering, University of Delaware, Newark

来源：

APPLIED PHYSICS LETTERS | 1997年 / 70卷 / 06期

关键词：

D O I：

10.1063/1.118272

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We modify a scanning-force microscope tip/cantilever with a coaxial metal shield for use as an ultra-small field probe, observing 39 ps waveforms on an integrated circuit at a spatial resolution set by the tip radius, the first direct measurements of electric field at these levels of temporal and spatial resolution. This new ability to acquire topography while maintaining constant tip-sample distance for calibrated measurement or excitation of near-zone picosecond time-resolved electric fields is useful not only for probing advanced circuits but also for localized broadband spectroscopy of condensed matter and biological samples. (C) 1997 Americnn Institute of Physics.

引用

收藏

页码：677 / 679

页数：3

相关论文

共 18 条

[1] SUPER-RESOLUTION APERTURE SCANNING MICROSCOPE [J].

ASH, EA ;

NICHOLLS, G .

NATURE, 1972, 237 (5357) :510-&

[2] Electrons in artificial atoms [J].

Ashoori, RC .

NATURE, 1996, 379 (6564) :413-419

[3] A comparative study of four open-ended coaxial probe models for permittivity measurements of lossy dielectric biological materials at microwave frequencies [J].

Berube, D ;

Ghannouchi, FM ;

Savard, P .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1996, 44 (10) :1928-1934

[4] NEAR-FIELD OPTICS - MICROSCOPY, SPECTROSCOPY, AND SURFACE MODIFICATION BEYOND THE DIFFRACTION LIMIT [J].

BETZIG, E ;

TRAUTMAN, JK .

SCIENCE, 1992, 257 (5067) :189-195

[5] Advances in ultrafast scanning tunneling microscopy [J].

Botkin, D ;

Glass, J ;

Chemla, DS ;

Ogletree, DF ;

Salmeron, M ;

Weiss, S .

APPLIED PHYSICS LETTERS, 1996, 69 (09) :1321-1323

[6] SCANNING ELECTROMAGNETIC TRANSMISSION-LINE MICROSCOPE WITH SUB-WAVELENGTH RESOLUTION [J].

FEE, M ;

CHU, S ;

HANSCH, TW .

OPTICS COMMUNICATIONS, 1989, 69 (3-4) :219-224

[7] Novel millimeter-wave near-field resistivity microscope [J].

Golosovsky, M ;

Davidov, D .

APPLIED PHYSICS LETTERS, 1996, 68 (11) :1579-1581

[8] HIGH-SPEED INTEGRATED-CIRCUIT PROBING USING A SCANNING FORCE MICROSCOPE SAMPLER [J].

HO, F ;

HOU, AS ;

BLOOM, DM .

ELECTRONICS LETTERS, 1994, 30 (07) :560-562

[9] PICOSECOND ELECTRICAL SAMPLING USING A SCANNING FORCE MICROSCOPE [J].

HOU, AS ;

HO, F ;

BLOOM, DM .

ELECTRONICS LETTERS, 1992, 28 (25) :2302-2303

[10] FIR MICROSCOPY [J].

KEILMANN, F .

INFRARED PHYSICS & TECHNOLOGY, 1995, 36 (01) :217-224