Erbium in GaAs: Coupling with native defects

被引:8
作者
Taguchi, A [1 ]
Ohno, T [1 ]
机构
[1] NATL RES INST MET, TSUKUBA, IBARAKI 305, JAPAN
关键词
D O I
10.1103/PhysRevB.56.9477
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We calculated the total energy of Er point defects in GaAs and of Er defects coupled with native defects in GaAs by the ab initio pseudopotential method. The total-energy calculation indicates that various coupled defects comprising an Er atom and native defects will be formed depending on the growth conditions and the Fermi-level position. By investigating the valence charge distribution, it was found that an Er atom forms a strong bond with an As atom. This chemical feature and the lattice relaxation around the coupled defect are the main factors that stabilize the coupled states. The intra-4f-shell luminescence spectrum of Er in GaAs is generally complicated and strongly depends on sample preparation methods and growth conditions. We propose that this tendency is due to the sample-dependent concentration of various defects that form complexes with Er.
引用
收藏
页码:9477 / 9487
页数:11
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