Measurement of 1/f noise and its application in materials science

被引：86

作者：

Raychaudhuri, AK ^{[1
]}

机构：

[1] Indian Inst Sci, Dept Phys, Bangalore 560012, Karnataka, India

来源：

CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE | 2002年 / 6卷 / 01期

关键词：

D O I：

10.1016/S1359-0286(02)00025-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This is a review of the measurement of I If noise in certain classes of materials which have a wide range of potential applications. This includes metal films, semi-conductors, metallic oxides and inhomogeneous systems such as composites. The review contains a basic introduction to this field, the theories and models and follows it up with a discussion on measurement methods. There are discussions on specific examples of the application of noise spectroscopy in the field of materials science. (C) 2002 Elsevier Science Ltd. All rights reserved.

引用

页码：67 / 85

页数：19

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