HREM study of ion implantation in 6H-SiC at high temperatures

被引:8
作者
Lebedev, OI
VanTendeloo, G
Suvorova, AA
Usov, IO
Suvorov, AV
机构
[1] UNIV ANTWERP,RUCA,EMAT,B-2020 ANTWERP,BELGIUM
[2] AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA
[3] CREE RES INC,DURHAM,NC 27713
关键词
high-resolution electron microscopy; silicon carbide; ion implantation; high temperature;
D O I
10.1093/oxfordjournals.jmicro.a023520
中图分类号
TH742 [显微镜];
学科分类号
摘要
Implantation of aluminium into 6H-SiC at high temperature and at a high dose results in the formation of aluminium precipitates with a definite orientation relationship to the matrix. [2110](6H-SiC//)[011](Al) and [0001](6H-SiC)//[111]Al. Under these implantation conditions the polytypic transformation of 6H-SiC into 3C no longer occurs by gliding but through the generation of interstitial semi-loops at the precipitates. It is shown that the formation of Al precipitates is strongly dependent on the dose of implantation. In the absence of precipitates in the 6H-SiC the usual glide mechanism for the polytypic transformation is maintained. These conclusions are based on high-resolution electron microscopy observations.
引用
收藏
页码:271 / 279
页数:9
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