[3] Cornell Univ, Dept Elect & Comp Engn, Ithaca, NY 14853 USA
[4] Univ Nebraska Licoln, Dept Elect Engn & Ctr Mat Res & Anal CMRA, Lincoln, NE USA
来源:
PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 3, NO 6
|
2006年
/
3卷
/
06期
关键词:
D O I:
10.1002/pssc.200565467
中图分类号:
TQ174 [陶瓷工业];
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
We determine the anisotropic electron effective mass and mobility parameters in wurtzite InN thin films with free electron concentration N from 1.8 X 10(17) cm(-3) to 9.5 X 10(18) cm(-3) using Infrared Magneto-optic Generalized Ellipsometry. The room-temperature measurements were carried out with magnetic fields up to 4.5 T. For the Gamma-point we estimate m(perpendicular to)* = 0.047mo and m(parallel to)* = 0.039mo; for polarization perpendicular and parallel to the c-axis, respectively. Scattering by impurities or ionized donors may explain the decrease of mobility for polarization parallel to the c-axis from 1600 cm(2)/(VS) to 800 cm(2)/(VS) with increase in N, where the perpendicular mobility is further decreased, likely caused by additional grain boundary scattering. (c) 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.