In situ synchrotron X-ray studies of ferroelectric thin films

被引：33

作者：

Fong, Dillon D.

Thompson, Carol

机构：

[1] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA

[2] No Illinois Univ, Dept Phys, De Kalb, IL 60115 USA

来源：

ANNUAL REVIEW OF MATERIALS RESEARCH | 2006年 / 36卷

关键词：

ferroelectric phase transition; size effects; 180 degrees domains; epitaxial growth; surface scattering;

D O I：

10.1146/annurev.matsci.36.090804.100242

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This paper reviews recent in situ studies of ferroelectric thin films using synchrotron X-ray scattering, with an emphasis on single-crystal perovskite films. We describe observations of thin film growth, the ferroelectric phase transition, and structural evolution during ferroelectric switching. The importance of quantitatively characterizing the internal structure of ferroelectric films under controlled electrical and mechanical boundary conditions is discussed.

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收藏

页码：431 / 465

页数：35

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