Photoelectron spectromicroscopy of electrochemically induced oxygen spillover at the Pt/YSZ interface

被引：54

作者：

Luerssen, B

Günther, S

Marbach, H

Kiskinova, M

Janek, J

Imbihl, R

机构：

[1] Univ Hannover, Inst Phys Chem & Elektrochem, D-30167 Hannover, Germany

[2] Sincrotrone Trieste, I-34012 Trieste, Italy

来源：

CHEMICAL PHYSICS LETTERS | 2000年 / 316卷 / 5-6期

关键词：

D O I：

10.1016/S0009-2614(99)01302-0

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Scanning photoelectron microscopy (SPEM) has been applied to study the processes at the interface between the oxygen ion conducting solid electrolyte YSZ (yttrium stabilized zirconia) and a microstructured 500 Angstrom thick Pt film on top of the YSZ when electrical potentials are applied. An electrochemically induced oxygen spillover onto the Pt surface has been observed upon electrochemical pumping with a positive potential applied to the Pt film. The spillover species was characterized in X-ray photoelectron spectroscopy by an Ols binding energy of 530.4 eV which is identical to that of chemisorbed oxygen from the gas phase. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：331 / 335

页数：5

共 18 条

[1] THE SEGREGATION AND OXIDATION OF SILICON ON PT(111), OR - THE QUESTION OF THE PLATINUM OXIDE [J].