Room temperature performance of submicron bismuth Hall probes

被引：9

作者：

Petit, D

Atkinson, D

Johnston, S

Wood, D

Cowburn, RP

机构：

[1] Univ Durham, Dept Phys, Nanoscale Magnet Grp, Durham DH1 3LE, England

[2] Univ Durham, Sch Engn, Ctr Elect Syst, Durham DH1 3LE, England

[3] Univ Durham, Sch Engn, Microsyst Technol Grp, Durham DH1 3LE, England

来源：

IEE PROCEEDINGS-SCIENCE MEASUREMENT AND TECHNOLOGY | 2004年 / 151卷 / 02期

关键词：

D O I：

10.1049/ip-smt:20040167

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We report on the room temperature performance of bismuth Hall probes fabricated using focused ion beam milling. The sensitivity of the devices has been studied for a wide range of sizes (50 nm-10 mum) and for three film thicknesses: 29, 78 and 152 nm. It was found that the sensitivity of such probes is not limited by Johnson noise and is strongly dependent on both the thickness of the film and the dimensions of the device. The results are discussed in terms of practical applications to Scanning Hall Probe Microscopy.

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页码：127 / 130

页数：4

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