The gate bias and geometry dependence of random telegraph signal amplitudes

被引:26
作者
Martin, ST [1 ]
Li, GP [1 ]
Worley, E [1 ]
White, J [1 ]
机构
[1] ROCKWELL INT CORP,ROCKWELL SEMICOND SYST,NEWPORT BEACH,CA 92658
关键词
D O I
10.1109/55.622524
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new random telegraph signal (RTS) amplitude model based upon band bending fluctuations has been developed, In contrast to other studies of RTS noise amplitudes, which are derived from RTS fitting parameters, it is demonstrated in this work that noise amplitudes may be predicted from band bending calculations and device de characteristics. This new model suggests that the decrease in band bending associated with slow-state trapping results in mobility degradation for Low gate biases (Coulombic-scattering-limited) and an enhancement in mobility due to vertical field reductions at high gate biases (surface roughness/phononscattering limited). The band bending formulation shows good correlation with experimental data and accurately predicts the observed dependence upon effective channel length and width.
引用
收藏
页码:444 / 446
页数:3
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