Mathematical modeling of polish-rate decay in chemical-mechanical polishing

被引:50
作者
Borucki, L [1 ]
机构
[1] Motorola Inc, Mesa, AZ 85202 USA
关键词
chemical-mechanical polishing; Hamilton-Jacobi equation; polymer wear; rate decay; surface statistics;
D O I
10.1023/A:1020305108358
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A model is presented for polish-rate decay in chemical-mechanical polishing based on the Greenwood-Williamson theory of contact between a smooth surface (a wafer) and a rough surface (the polishing pad). The model assumes that polishing causes pad asperities to wear, with high asperities wearing faster than low asperities. Model predictions of the time dependence of polish-rate decay compare favorably with experiments.
引用
收藏
页码:105 / 114
页数:10
相关论文
共 8 条
[1]   CONTACT AND RUBBING OF FLAT SURFACES [J].
ARCHARD, JF .
JOURNAL OF APPLIED PHYSICS, 1953, 24 (08) :981-988
[2]   CONTACT OF NOMINALLY FLAT SURFACES [J].
GREENWOOD, JA ;
WILLIAMSON, JB .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1966, 295 (1442) :300-+
[3]  
Johnson K. L., 1987, CONTACT MECH
[4]  
LAWING AS, 2002, P 2002 MAT RES SOC S
[5]  
OLIVER MR, 2000, P 4 INT S CHEM MECH, P77
[6]  
Preston F.W., 1927, J SOC GLASS TECHNOLO, V11, P214
[7]  
SHAN L, 2000, THESIS GEORGIA I TEC
[8]   Optical interferometry for surface measurements of CMP pads [J].
Stein, D ;
Hetherington, D ;
Dugger, M ;
Stout, T .
JOURNAL OF ELECTRONIC MATERIALS, 1996, 25 (10) :1623-1627