Evaluation of langasite (La3Ga5SiO14) as a material for high temperature microsystems

被引:23
作者
Ansorge, Erik
Schimpf, Stefan [1 ]
Hirsch, Soeren
Sauerwald, Jan
Fritze, Holger
Schmidt, Bertram
机构
[1] Otto Von Guericke Univ, Inst Micro & Sensor Syst, D-39016 Magdeburg, Germany
[2] Tech Univ Clausthal, Dept Phys Met & Mat Sci, Clausthal Zellerfeld, Germany
关键词
langasite; wet chemical etching; pMEMS; high temperature; cantilever beam;
D O I
10.1016/j.sna.2005.12.015
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Lanthanum gallium silicate (langasite, La3Ga5SiO14) is a piezoelectric material with promising properties for micro-electromechanical applications at high temperatures. So far it has been used for SAW and BAW devices. This paper reports on the possibility of fabricating microstructures in langasite by wet chemical etching. The etching behavior of different chemicals applying different mask materials is investigated. As a first demonstrator a cantilever beam in langasite is produced showing the possibility of MEMS in langasite. The mechanical velocity spectrum and the electrical spectrum are recorded. Elevated temperatures are applied to the beam and another spectrum is recorded proving the functionality up to 700 degrees C. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:393 / 396
页数:4
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