A coupled plasma and sheath model for high density reactors

被引:6
作者
Bose, D [1 ]
Govindan, TR
Meyyappan, M
机构
[1] NASA, Ames Res Ctr, Eloret Corp, Moffett Field, CA 94035 USA
[2] NASA, Ames Res Ctr, NASA Adv Supercomp Div, Moffett Field, CA 94035 USA
[3] NASA, Ames Res Ctr, Ctr Nanotechnol, Moffett Field, CA 94035 USA
基金
美国国家航空航天局;
关键词
plasma materials-processing applications; plasma sheaths; simulation;
D O I
10.1109/TPS.2002.1024264
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
We present a coupled plasma and collisionless sheath model for the simulation of high-density plasma processing reactors. Due to inefficiencies in numerical schemes and the resulting computational burden, a coupled multidimensional plasma and sheath simulation has not been possible for gas mixtures and high-density reactors of practical interest. In this work, we demonstrate that with a fully implicit algorithm and a refined computational mesh, a self-consistent simulation of a reactor including both the plasma and sheath is feasible. We discuss the details of the model equations, the importance of ion inertia, and the resulting sheath profiles for argon and chlorine plasmas. We find that at low operating pressures (10-30 mtorr), the charge separation occurs only within a 0.5-mm layer near the surface in a 300 mm inductively coupled plasma etch reactor. A unified simulation eliminates the use of offline or loosely coupled and oversimplified sheath models which generally leads to uncertainties in ion flux and sheath electrical properties.
引用
收藏
页码:653 / 659
页数:7
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