Atomic transport in germanium and the mechanism of arsenic diffusion

被引:68
作者
Bracht, Hartmut [1 ]
Brotzmann, Sergej [1 ]
机构
[1] Univ Munster, Inst Mat Phys, D-48149 Munster, Germany
关键词
germanium; self-diffusion; dopant diffusion; arsenic; vacancy;
D O I
10.1016/j.mssp.2006.08.041
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The paper reviews some basic aspects of self- and foreign-atom diffusion in germanium (Ge) and provides new experimental results on the intrinsic and extrinsic diffusion of arsenic (As) in Ge. Experiments of As diffusion in Ge have been performed at temperatures between 640 and 920 degrees C utilizing a diluted Ge-As alloy as diffusion source. The As profiles were measured by means of the spreading resistance technique. Depending on the As concentration established at the surface, intrinsic and extrinsic As profiles were obtained. Arsenic diffusion in Ge is fully described on the basis of the vacancy mechanism taking into account singly negatively charged As-vacancy pairs. In contrast to a recent study of Vainonen-Ahigren et al. (Appl. Phys. Lett. 77 (2000) 690), which claims that As diffusion is mediated by neutral and doubly negatively charged vacancies, we show that As diffusion is not sensitive to the properties of vacancies. From our experiments we determine an activation enthalpy of 2.70eV and a pre-exponential factor of 30 cm(2) s(-1) for intrinsic As diffusion in Ge. (C) 2006 Elsevier Ltd. All rights reserved.
引用
收藏
页码:471 / 476
页数:6
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