Beamtest of nonirradiated and irradiated ATLAS SCT microstrip modules at KEK

被引:11
作者
Unno, Y [1 ]
Matuo, T
Hashizaki, T
Akimoto, T
Bernabeu, J
Dolezal, Z
Eklund, L
Hara, K
Ikegami, Y
Iwata, Y
Kato, Y
Ketterer, C
Kobayashi, H
Kohriki, T
Kondo, T
Koshino, T
Ludwig, J
Masuda, T
Moorhead, G
Nakano, I
Norimatsu, K
Ohsugi, T
Runge, K
Shinma, S
Takashima, R
Tanaka, R
Tanimoto, N
Terada, S
Ujiie, N
Vos, M
Yamanaka, K
Yamashita, T
机构
[1] KEK, High Energy Accelerator Res Org, Inst Particle & Nucl Studies, Tsukuba, Ibaraki 3050801, Japan
[2] Okayama Univ, Dept Phys, Okayama 7008530, Japan
[3] Univ Tsukuba, Inst Phys, Tsukuba, Ibaraki 3058571, Japan
[4] Univ Valencia, CSIC, Inst Fis Corpuscular, E-46071 Valencia, Spain
[5] Charles Univ Prague, Inst Particle & Nucl Phys, CZ-18000 Prague 8, Czech Republic
[6] Uppsala Univ, Dept Radiat Sci, S-75121 Uppsala, Sweden
[7] Hiroshima Univ, Dept Phys, Higashihiroshima 7398526, Japan
[8] Univ Freiburg, Dept Phys, D-79104 Freiburg, Germany
[9] Univ Melbourne, Sch Phys, Parkville, Vic 3052, Australia
[10] Kyoto Univ Educ, Dept Educ, Kyoto 6120863, Japan
基金
澳大利亚研究理事会;
关键词
radiation damage effects; silicon microstrip radiation detectors;
D O I
10.1109/TNS.2002.801505
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Nonirradiated and irradiated ATLAS silicon microstrip barrel and endcap modules have been beamtested with 4-GeV/c pions. Pulse shapes confirmed the peaking time of the amplifier to be 22 ns with slight deterioration in the irradiated modules. Median charges saturated around 3.8 fC, both in the nonirradiated and the irradiated modules. Signal/noise ratios, using the noise estimates from the in-situ calibration, were >16 in the nonirradiated (>150 V) and >10 in the irradiated (>300 V) barrel modules. No excess common-mode noise was observed.
引用
收藏
页码:1868 / 1875
页数:8
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