Anodic photodissolution of n-InP, under electroless conditions

被引:5
作者
Debiemme-Chouvy, C
Quennoy, A
机构
[1] Univ Versailles, IREM, CNRS, UMR 8637, F-78000 Versailles, France
[2] Univ Paris 06, LISE, CNRS, UPR 15, F-75252 Paris 05, France
[3] ALTIS Semicond, F-91105 Corbeil Essonnes, France
关键词
InP; polyoxometalates; SiMo12O404-; electroless photoetching; surface states; Cl-;
D O I
10.1016/j.electacta.2004.02.027
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
In the presence of alpha-SiMo12O404- ions dissolved in acidic solution and under laser irradiation, the electroless photoetching of n-type InP is achieved. At the laser impact, the semiconductor is oxidized while SiMo12O404- species are reduced. The shape of the pit formed, due to the photoanodic dissolution of the material, depends on the experimental conditions, notably on the presence or not of Cl- ions in the medium. It can have either a Gaussian shape or a flat bottom. To specify the charge transfer which occurs at the n-InP/solution illuminated interface, some electrochemical studies were performed on n- and p-type InP electrodes. In fact, the reduction of SiMo12O404- ions occurs by capture of electrons from the InP conduction band. Considering the energetic situation at the InP/electrolyte interface and some electrochemical results, it is concluded that the electron transfer from InP to SiMo12 is mediated by surface states. The influence of Cl- ions on the n-InP photodissolution process is also discussed. (C) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码:3129 / 3136
页数:8
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