Use of photoelectron microscopes as X-ray detectors for imaging and other applications

被引：10

作者：

Hwu, Y ^{[1
]}

Tsai, WL

Lai, B

Mancini, DC

Je, JH

Noh, DY

Youn, HS

Hwang, CS

Cerrina, F

Swiech, W

Bertolo, M

Tromba, G

Margaritondo, G

机构：

[1] Acad Sinica, Inst Phys, Taipei, Taiwan

[2] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

[3] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang, South Korea

[4] Kwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju, South Korea

[5] Kwangju Inst Sci & Technol, Ctr Elect Mat Res, Kwangju, South Korea

[6] Pohang Univ Sci & Technol, Pohang Accelerator Lab, Pohang, South Korea

[7] Synchrotron Radiat Res Ctr, Hsinchu, Taiwan

[8] Univ Wisconsin, Dept Elect & Comp Engn, Madison, WI 53706 USA

[9] Univ Illinois, Frederick Seitz Mat Res Lab, Urbana, IL 61801 USA

[10] Sincrotrone Trieste, I-34012 Trieste, Italy

[11] Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1999年 / 437卷 / 2-3期

关键词：

D O I：

10.1016/S0168-9002(99)00757-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We demonstrate with practical tests that a photoelectron emission microscope (PEEM) can be advantageously used as a high-lateral-resolution detector of X-rays. The advantages of this approach are discussed, in particular for coherence-based techniques. (C) 1999 Published by Elsevier Science B.V. All rights reserved.

引用

页码：516 / 520

页数：5

共 24 条

[1] Diffraction enhanced x-ray imaging [J].