Soft-x-ray transmission photoelectron spectromicroscopy with the MEPHISTO system

被引：15

作者：

De Stasio, G ^{[1
]}

Gilbert, B

Perfetti, L

Fauchoux, O

Valiquer, A

Nelson, T

Capozi, M

Baudat, PA

Cerrina, F

Chen, Z

Perfetti, P

Tonner, BP

Margaritondo, G

机构：

[1] Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland

[2] CNR, Ist Struttura Mat, I-00133 Rome, Italy

[3] Univ Rome Tor Vergata, Dipartimento Fis, Rome, Italy

[4] Univ Wisconsin, Ctr Synchrotron Radiat, Stoughton, WI 53589 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1998年 / 69卷 / 09期

关键词：

D O I：

10.1063/1.1149067

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We complemented with data taken in transmission mode the recently described tests of the novel spectromicroscope MEPHISTO (Microscope a Emission de Photoelectrons par Illumination Synchrotronique de type Onduleur). Transmitted x rays were converted by a photocathode into photoelectrons, which were subsequently electron-optically processed by the spectromicroscope producing submicron-resolution images. Test images demonstrated excellent contrast. (C) 1998 American Institute of Physics. [S0034-6748(98)02409-5]

引用

页码：3106 / 3108

页数：3

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