Hexagonal polymorph of tantalum-pentoxide with enhanced dielectric constant

被引:41
作者
Hiratani, M [1 ]
Kimura, S
Hamada, T
Iijima, S
Nakanishi, N
机构
[1] Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 1858601, Japan
[2] Hitachi Ltd, Adv Res Lab, Kokubunji, Tokyo 1858601, Japan
[3] Hitachi Ltd, Semicond & Integrated Circuits, Tokyo 1988512, Japan
关键词
D O I
10.1063/1.1509861
中图分类号
O59 [应用物理学];
学科分类号
摘要
A tantalum-pentoxide dielectric with an enhanced permittivity of over 50 was found to be crystallized in a hexagonal symmetry with a=0.628 nm and c=0.389 nm. The incommensurate epitaxy of tantalum pentoxide on hcp-ruthenium metal stabilizes the hexagonal phase with root3-time periodicity in plane, as compared with that of the known hexagonal delta phase. The crystallographic assumption, which is based on one-dimensional Ta-O-Ta chain along the c axis, can explain large polarizability caused by delocalized electrons on the one-dimensional chain. (C) 2002 American Institute of Physics.
引用
收藏
页码:2433 / 2435
页数:3
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