Characterisation of plasmas by advanced diagnostic methods

被引:6
作者
Wiesemann, K
机构
[1] Experimentalphysik Insbes. G., Ruhr-Universität Bochum
关键词
D O I
10.1351/pac199668051029
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The paper discusses the problems with measuring characteristic plasma quantities under the nonideal conditions of plasma chemistry in low pressure discharges and gives an overview over ideas and methods for improving shortcomings of some principal diagnostic methods.
引用
收藏
页码:1029 / 1034
页数:6
相关论文
共 45 条
[1]   PLASMAS WITH NEGATIVE-IONS - PROBE MEASUREMENTS AND CHARGE EQUILIBRIUM [J].
AMEMIYA, H .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1990, 23 (08) :999-1014
[2]   Plasma diagnostics in negative ion sources [J].
Bacal, M. .
PLASMA SOURCES SCIENCE & TECHNOLOGY, 1993, 2 (03) :190-197
[3]   ION SATURATION CURRENTS TO SPHERICAL AND CYLINDRICAL ELECTROSTATIC PROBES IN COLLISIONAL PLASMAS [J].
BENILOV, MS ;
ROGOV, BV .
JOURNAL OF APPLIED PHYSICS, 1991, 70 (11) :6726-6731
[4]  
BIBINOV N, IN PRESS
[5]   AN ELECTROSTATIC-PROBE TECHNIQUE FOR RF PLASMA [J].
BRAITHWAITE, NS ;
BENJAMIN, NMP ;
ALLEN, JE .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1987, 20 (08) :1046-1049
[6]   THE INSTANTANEOUS TRIPLE-PROBE METHOD FOR THE DIRECT DISPLAY OF PLASMA PARAMETERS IN A LOW-DENSITY CONTINUUM PLASMA [J].
CHANG, JS ;
OGRAM, GL ;
HOBSON, RM ;
TEII, S .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1980, 13 (06) :1083-1092
[7]   INSTANTANEOUS DIRECT-DISPLAY SYSTEM OF PLASMA PARAMETERS BY MEANS OF TRIPLE PROBE [J].
CHEN, SL ;
SEKIGUCHI, T .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (08) :2363-+
[8]  
Cherrington B E, 1982, Plasma Chemistry and Plasma Processing, V2, P113, DOI DOI 10.1007/BF00633129
[9]   LANGMUIR PROBE CHARACTERISTICS IN A HIGH-PRESSURE PLASMA IN THE PRESENCE OF CONVECTION AND IONIZATION [J].
CLEMENTS, RM ;
RIZVI, SAH ;
SMY, PR .
IEEE TRANSACTIONS ON PLASMA SCIENCE, 1994, 22 (04) :435-441
[10]   ELECTRON-ENERGY DISTRIBUTION FUNCTION MEASUREMENTS IN CAPACITIVELY COUPLED RF DISCHARGES [J].
DILECCE, G ;
CAPITELLI, M ;
DEBENEDICTIS, S .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (01) :121-128