Field-Induced Carrier Delocalization in the Strain-Induced Mott Insulating State of an Organic Superconductor

被引:47
作者
Kawasugi, Yoshitaka [1 ,2 ]
Yamamoto, Hiroshi M. [2 ]
Tajima, Naoya [2 ]
Fukunaga, Takeo [2 ]
Tsukagoshi, Kazuhito [3 ]
Kato, Reizo [1 ,2 ]
机构
[1] Saitama Univ, Saitama 3388570, Japan
[2] RIKEN, Wako, Saitama 3510198, Japan
[3] MANA, NIMS, Tsukuba, Ibaraki 3050044, Japan
关键词
2-DIMENSIONAL HUBBARD-MODEL; TRANSITIONS;
D O I
10.1103/PhysRevLett.103.116801
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We report the influence of the field effect on the dc resistance and Hall coefficient in the strain-induced Mott insulating state of an organic superconductor kappa-dBEDT-TTF2Cu[N(CN)(2)]Br. Conductivity obeys the formula for an activated transport sigma(square) = sigma(0) expd(W= k(B)T) where sigma(0) is a constant and W depends on the gate voltage. The gate-voltage dependence of the Hall coefficient shows that, unlike in conventional field-effect transistors, the effective mobility of dense hole carriers (similar to 1.6 x 10(14) cm(-2)) is enhanced by a positive gate voltage. This implies that carrier doping involves delocalization of intrinsic carriers that were initially localized due to electron correlation.
引用
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页数:4
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