Imaging the Electric-Field Distribution in Organic Devices by Confocal Electroreflectance Microscopy

被引：9

作者：

Celebrano, Michele ^{[1
]}

Sciascia, Calogero ^{[1
]}

Cerullo, Ciulio ^{[1
]}

Zavelani-Rossi, Margherita ^{[1
]}

Lanzani, Guglielmo ^{[1
]}

Cabanillas-Gonzalez, Juan ^{[1
]}

机构：

[1] Politecn Milan, Dipartimento Fis, I-20133 Milan, Italy

来源：

ADVANCED FUNCTIONAL MATERIALS | 2009年 / 19卷 / 08期

关键词：

LIGHT-EMITTING-DIODES; THIN-FILMS; ELECTROABSORPTION SPECTROSCOPY; TRANSISTORS; TRANSPORT; ABERRATIONS; CONTRAST;

D O I：

10.1002/adfm.200801264

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Space resolved Stark spectroscopy is introduced as a non invasive optical technique for imaging electrirfield distribution in organic semiconductors. Stark spectroscopy relies on the electric field induced change in the absorption/reflection. It is shown that local monitoring of Stark shift with confocal spatial resolution provides quantitative information on the strength of the local field as well as charge distribution within the transport channel.

引用

页码：1180 / 1185

页数：6

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