Fabrication of three-dimensional microstructures by high resolution x-ray lithography

被引:14
作者
Cuisin, C [1 ]
Chen, Y
Decanini, D
Chelnokov, A
Carcenac, F
Madouri, A
Lourtioz, JM
Launois, H
机构
[1] CNRS, Microstruct & Microelect Lab, F-92225 Bagneux, France
[2] CNRS, Inst Elect Fondamentale, UMR 8622, F-91405 Orsay, France
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1999年 / 17卷 / 06期
关键词
D O I
10.1116/1.591027
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We describe the fabrication of three-dimensional (3D) microstructures by high-resolution x-ray lithography (XRL) as the first step in the realization of photonic band gap (PBC) materials for infrared wavelengths. In the soft x-ray range (lambda similar to 1 nm), conventional XRL mask technology can be adopted which allowed us to pattern 3D features with relatively thick resist layers. We have checked the possibility of making diamond-like PEG microstructures by three consecutive exposures under tilt angle of 35.26 degrees with respect to the incoming beam and a rotation angle of 120 degrees between each exposure. Exposures were done in a vacuum chamber with a broadband synchrotron radiation (SuperACO) and three types of experimental configurations. As results, we obtain diamond-like structures showing several (111) lattice periods in polymethyl methacrylate resist. (C) 1999 American Vacuum Society. [S0734-211X(99)04306-1].
引用
收藏
页码:3444 / 3448
页数:5
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