High-density groove mastering using an electron beam recorder and plasma etching process

被引:10
作者
Katsumura, M
Nishiwaki, H
Mitsuhata, T
Okano, M
Iida, T
Kouchiyama, A
Inoue, H
机构
[1] PIONEER Corp, Adv Disk Syst Dept, Tsurgashima, Saitama 3502288, Japan
[2] AV IT Dev Grp Sony Corp, Opt Disc Dev Div, Shinagawa Ku, Tokyo 1410001, Japan
[3] TDK Corp, Opt Device Dev Data Storage Technol Ctr, Nagano 3850009, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2002年 / 41卷 / 3B期
关键词
optical disk; mastering; electron beam; plasma etching; groove recording; jitter;
D O I
10.1143/JJAP.41.1698
中图分类号
O59 [应用物理学];
学科分类号
摘要
An electron beam recorder (EBR) has been confirmed to have high-resolution performance and we think it is a promising recorder to produce a master stamper for the next-generation high-density optical disks. Because the high-density groove recording disk requires a narrower track pitch, the improvement of the recording resolution of the mastering recorder is necessary. However, owing to electron scattering, fabricating a groove structure was difficult even when we use a finely controlled conventional EB mastering process. A plasma etching process is an expected process as one of the solutions. Consequently, we adopted the plasma etching process for high-density groove disk mastering. A data bit length of 112 nm/bit was successfully recorded on the groove disk at a wavelength of 405 nm and an objective lens of 0.85 numerical aperture.
引用
收藏
页码:1698 / 1703
页数:6
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