ZnO thin film grown on silicon by metal-organic chemical vapor deposition

被引:31
作者
Wang, XQ
Yang, SR
Yang, XT
Liu, D
Zhang, YT
Wang, JH
Yin, JZ
Liu, DL
Ong, HC
Du, GT [1 ]
机构
[1] Jilin Univ, Dept Elect Engn, State Key Lab Integrated Optoelect, Changchun 130023, Peoples R China
[2] Chinese Univ Hong Kong, Dept Elect Engn, Hong Kong, Hong Kong, Peoples R China
基金
中国国家自然科学基金;
关键词
metalorganic chemical vapor deposition; oxides; semiconducting II-VI materials;
D O I
10.1016/S0022-0248(02)01372-6
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
We deposited ZnO thin films on (00 1) Si substrate by metal-organic chemical vapor deposition. We found strong diffraction (0 0 2) peak at 34.76degrees and (0 0 4) peak at 72.84degrees indicating that ZnO thin film was strongly C-oriented. The full-width at half-maximum of (0 0 2) peak was 0.19degrees. ZnO film was highly transparent with a transmission ratio larger than 80% in the visible range. Ultraviolet emission was observed while deep level emission could hardly been observed in room temperature photoluminescence spectra. From temperature-dependent spectra of 300-80 K, we could observe neutral donor (DdegreesX) bound exciton emission clearly and free-exciton emission dominated the spectrum when the temperature was above 220 K. X-ray photoemission spectra showed that ZnO film was Zn-rich with O:Zn = 0.93:1. (C) 2002 Published by Elsevier Science B.V.
引用
收藏
页码:13 / 18
页数:6
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