Thickness-independent electron field emission from tetrahedral amorphous carbon films

被引：20

作者：

Zhao, JP ^{[1
]}

Chen, ZY

Wang, X

Shi, TS

Yano, T

机构：

[1] Chinese Acad Sci, Shanghai Inst Met, Ion Beam Lab, Shanghai 200050, Peoples R China

[2] Shikoku Natl Ind Res Inst, Takamatsu, Kagawa 7610395, Japan

来源：

APPLIED PHYSICS LETTERS | 2000年 / 76卷 / 02期

关键词：

D O I：

10.1063/1.125699

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Electron field emission properties of tetrahedral amorphous carbon films of different thicknesses have been studied. The experimental results indicate that there exists no close relationship between threshold electric field and film thickness. Different field emission models are used to examine the experimental results in order to explain the thickness-independent electron field emission properties. (C) 2000 American Institute of Physics. [S0003-6951(00)01102-5].

引用

页码：191 / 193

页数：3

共 18 条

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