Refractive index of AlGaInN alloys

被引：52

作者：

Peng, T

Piprek, J

机构：

[1] Materials Science Program, University of Delaware, Newark

来源：

ELECTRONICS LETTERS | 1996年 / 32卷 / 24期

关键词：

refractive index; III-V semiconductors;

D O I：

10.1049/el:19961546

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The refractive index of quaternary nitride alloys is calculated for the transparent ultraviolet to green wavelength range (370-565nm) by nonlinear interpolation of binary alloy parameters measured. Results given as function of composition for different substrates show strong deviations from linear interpolations.

引用

页码：2285 / 2286

页数：2

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