Analysis of NBTI degradation- and recovery-behavior based on ultra fast VT-measurements

被引：206

作者：

Reisinger, H. ^{[1
]}

Blank, O. ^{[2
]}

Heinrigs, W. ^{[1
]}

Muehloff, A. ^{[1
]}

Gustin, W. ^{[1
]}

Schluender, C. ^{[1
]}

机构：

[1] Corp Reliabil Methodol, Infineon Technol, Munich, Germany

[2] Technol Integrat, Infineon Technol, Regensburg, Germany

来源：

2006 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 44TH ANNUAL | 2006年

关键词：

D O I：

10.1109/RELPHY.2006.251260

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：448 / +

页数：2

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