Temperature dependence of ZnGeP2 birefringence using polarized light interference

被引:19
作者
Fischer, DW
Ohmer, MC
机构
[1] Wright Laboratory, Materials Directorate (WL/MLPO), Wright-Patterson AFB, Dayton, OH 45433-7707
关键词
D O I
10.1063/1.364075
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have measured the birefringence (Delta n) of ZnGeP2 throughout the 14-500 K temperature range using polarized light interference spectra obtained in transmittance from 0.7 to 12 mu m. It was found that Delta n continuously increases with temperature for all wavelengths but that the amount of increase is not constant with temperature as often assumed. Delta n increases by approximately 0.006 when the temperature changes from 14 to 500 K. The temperature derivative of the birefringence, d(Delta n)/dT, was determined at 50 K increments and its value was found to be quite dependent on the exact temperature range over which it was measured. It increases linearly with temperature, having a coefficient of 3.3x10(-8)/K. Actual d(Delta n)/dT values range from 5x10(-6)/K at the lowest temperature to 19x10(-6)/K at the highest. We conclude that the anomalously low phase matching angles observed for second-harmonic generation in ZnGeP2 are not associated with errors in birefringence values as previously speculated but instead are most likely due to nonlinear absorption phenomena.
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页码:425 / 431
页数:7
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