Microstructural evolution in lubricious ZnO films grown by pulsed laser deposition

被引:72
作者
Prasad, SV
Walck, SD
Zabinski, JS
机构
[1] Sandia Natl Labs, Albuquerque, NM 87185 USA
[2] PPG Ind Inc, Pittsburgh, PA 15238 USA
[3] USAF, Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
关键词
coatings; electron microscopy; tribology; zinc oxide;
D O I
10.1016/S0040-6090(99)00880-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Zinc oxide (ZnO) is well known to the electronic industry as a piezoelectric material. Recent research from this laboratory also indicates the potential of ZnO as a tribological material. The current work describes the evolution of microstructure with deposition parameters in pulsed laser deposited ZnO thin films, specifically targeted for friction and wear applications. Films were characterized by high resolution scanning electron microscopy (SEM), transmission electron microscopy (TEM), and X-ray diffraction (XRD). Friction and wear measurements were made using a ball-on-disk tribometer. Films were grown in vacuum (V) as well as in 5 mTorr of oxygen (O-2), while the substrates were kept at room temperature (RT). The RT/V ZnO films have (002) columnar texture with an average column width of 20 nm. The RT/O-2 films also are nanoclumnar with (002) texture, but each column is a mosaic of low-angle boundaries. Deformation mechanisms associated with nanocrystalline grain structure were analyzed with particular reference to sliding contact. Mechanisms to provide the observed low friction of RT/O-2 films (mu = 0.15-0.20) have been activated by its mosaic structure. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:107 / 117
页数:11
相关论文
共 36 条
[1]   THE EFFECT OF O-2 ON REACTIVELY SPUTTERED ZINC-OXIDE [J].
AITA, CR ;
PURDES, AJ ;
LAD, RJ ;
FUNKENBUSCH, PD .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (10) :5533-5536
[2]  
CAHN RW, 1955, IMPURITIES IMPERFECT
[3]  
DIETER GE, 1961, MECH METALLURGY, P123
[4]   Influence of processing variables on the structure and properties of ZnO films [J].
Exarhos, GJ ;
Sharma, SK .
THIN SOLID FILMS, 1995, 270 (1-2) :27-32
[5]   CONTROL OF PREFERRED ORIENTATION FOR ZNOX FILMS - CONTROL OF SELF-TEXTURE [J].
FUJIMURA, N ;
NISHIHARA, T ;
GOTO, S ;
XU, JF ;
ITO, T .
JOURNAL OF CRYSTAL GROWTH, 1993, 130 (1-2) :269-279
[6]   EPITAXIAL ZNO ON SAPPHIRE [J].
GALLI, G ;
COKER, JE .
APPLIED PHYSICS LETTERS, 1970, 16 (11) :439-&
[7]   NANOCRYSTALLINE MATERIALS [J].
BIRRINGER, R .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1989, 117 :33-43
[8]   INFLUENCE OF DEFECTS ON THE ELECTRONIC-STRUCTURE OF ZINC-OXIDE SURFACES [J].
GOPEL, W ;
LAMPE, U .
PHYSICAL REVIEW B, 1980, 22 (12) :6447-6462
[9]   HIGH-RATE DEPOSITION OF THICK PIEZOELECTRIC ZNO FILMS USING A NEW MAGNETRON SPUTTERING TECHNIQUE [J].
HATA, T ;
NODA, E ;
MORIMOTO, O ;
HADA, T .
APPLIED PHYSICS LETTERS, 1980, 37 (07) :633-635
[10]  
HICKERNELL FS, 1973, J APPL PHYS, V44, P1061, DOI 10.1063/1.1662307