Novel Gallium Complexes with Malonic Diester Anions as Molecular Precursors for the MOCVD of Ga2O3 Thin Films

被引:25
作者
Hellwig, Malte [1 ]
Xu, Ke [1 ]
Barreca, Davide [2 ,3 ]
Gasparotto, Alberto
Winter, Manuela [1 ]
Tondello, Eugenio
Fischer, Roland A. [1 ]
Devi, Anjana [1 ]
机构
[1] Ruhr Univ Bochum, Lehrstuhl Anorgan Chem 2, D-44780 Bochum, Germany
[2] Univ Padua, ISTM, CNR, I-35131 Padua, Italy
[3] Univ Padua, INSTM, Dept Chem, I-35131 Padua, Italy
关键词
Gallium; Chemical vapor deposition; Thin films; Oxides; O ligands; CHEMICAL-VAPOR-DEPOSITION; MASS SPECTROMETRIC ANALYSIS; ELECTRICAL-PROPERTIES; GROWTH; LUMINESCENCE; CHEMISTRY; SPECTRA; HAFNIUM; SENSOR;
D O I
10.1002/ejic.200801062
中图分类号
O61 [无机化学];
学科分类号
070301 ; 081704 ;
摘要
Five different homoleptic gallium complexes with malonic diester anions [Ga(ROCOCHOCOR)(3)] [R = Me (1), Et (2), iPr (3), tBu (4) and SiMe3 (5)] have been synthesised and characterised by H-1 and C-13 NMR, IR spectroscopy, electron ionisation mass spectrometry (EI-MS), and single-crystal X-ray diffraction. The thermal properties of the obtained compounds were evaluated by thermogravimetric studies to assess their suitability as precursors for the metal-organic chemical vapour deposition (MOCVD) of Ga2O3 thin films. MOCVD of Ga2O3 thin films was carried out starting from compound 2 in light of the promising features of this precursor. The as-deposited layers are amorphous and can be transformed into the monoclinic beta-Ga2O3 phase upon annealing at 1000 degrees C ex situ. The film morphology was studied by scanning electron microscopy (SEM), and its composition was investigated by energy-dispersive X-ray spectroscopy (EDXS) and X-ray photoelectron spectroscopy (XPS). Almost stoichiometric Ga2O3 thin films with low levels of carbon incorporation were obtained. ((C) Wiley-VCH Verlag GmbH & Co. KGaA, 69451 Weinheim, Germany, 2009)
引用
收藏
页码:1110 / 1117
页数:8
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