Novel Gallium Complexes with Malonic Diester Anions as Molecular Precursors for the MOCVD of Ga2O3 Thin Films

被引:25
作者
Hellwig, Malte [1 ]
Xu, Ke [1 ]
Barreca, Davide [2 ,3 ]
Gasparotto, Alberto
Winter, Manuela [1 ]
Tondello, Eugenio
Fischer, Roland A. [1 ]
Devi, Anjana [1 ]
机构
[1] Ruhr Univ Bochum, Lehrstuhl Anorgan Chem 2, D-44780 Bochum, Germany
[2] Univ Padua, ISTM, CNR, I-35131 Padua, Italy
[3] Univ Padua, INSTM, Dept Chem, I-35131 Padua, Italy
关键词
Gallium; Chemical vapor deposition; Thin films; Oxides; O ligands; CHEMICAL-VAPOR-DEPOSITION; MASS SPECTROMETRIC ANALYSIS; ELECTRICAL-PROPERTIES; GROWTH; LUMINESCENCE; CHEMISTRY; SPECTRA; HAFNIUM; SENSOR;
D O I
10.1002/ejic.200801062
中图分类号
O61 [无机化学];
学科分类号
070301 ; 081704 ;
摘要
Five different homoleptic gallium complexes with malonic diester anions [Ga(ROCOCHOCOR)(3)] [R = Me (1), Et (2), iPr (3), tBu (4) and SiMe3 (5)] have been synthesised and characterised by H-1 and C-13 NMR, IR spectroscopy, electron ionisation mass spectrometry (EI-MS), and single-crystal X-ray diffraction. The thermal properties of the obtained compounds were evaluated by thermogravimetric studies to assess their suitability as precursors for the metal-organic chemical vapour deposition (MOCVD) of Ga2O3 thin films. MOCVD of Ga2O3 thin films was carried out starting from compound 2 in light of the promising features of this precursor. The as-deposited layers are amorphous and can be transformed into the monoclinic beta-Ga2O3 phase upon annealing at 1000 degrees C ex situ. The film morphology was studied by scanning electron microscopy (SEM), and its composition was investigated by energy-dispersive X-ray spectroscopy (EDXS) and X-ray photoelectron spectroscopy (XPS). Almost stoichiometric Ga2O3 thin films with low levels of carbon incorporation were obtained. ((C) Wiley-VCH Verlag GmbH & Co. KGaA, 69451 Weinheim, Germany, 2009)
引用
收藏
页码:1110 / 1117
页数:8
相关论文
共 59 条
[51]   Synthesis and characterization of hafnium tert-butylacetoacetate as new MOCVD precursor for HfO2 films [J].
Pasko, S ;
Hubert-Pfalzgraf, LG ;
Abrutis, A .
MATERIALS LETTERS, 2005, 59 (14-15) :1836-1840
[52]   Optical properties of gallium oxide thin films [J].
Rebien, M ;
Henrion, W ;
Hong, M ;
Mannaerts, JP ;
Fleischer, M .
APPLIED PHYSICS LETTERS, 2002, 81 (02) :250-252
[53]   CO-sensor for domestic use based on high temperature stable Ga2O3 thin films [J].
Schwebel, T ;
Fleischer, M ;
Meixner, H ;
Kohl, CD .
SENSORS AND ACTUATORS B-CHEMICAL, 1998, 49 (1-2) :46-51
[54]  
Seah M.P., 1990, PRACTICAL SURFACE AN
[55]   High resolution X-ray photoelectron spectroscopy of beta gallium oxide films deposited by ultra high vacuum radio frequency magnetron sputtering [J].
Takeuchi, Toshio ;
Ishikawa, Hiroki ;
Takeuchi, Norikazu ;
Horikoshi, Yoshiji .
THIN SOLID FILMS, 2008, 516 (14) :4593-4597
[56]   OPTICAL ABSORPTION AND PHOTOCONDUCTIVITY IN BAND EDGE OF BETA-GA2O3 [J].
TIPPINS, HH .
PHYSICAL REVIEW, 1965, 140 (1A) :A316-&
[57]   Synthesis of homoleptic gallium alkoxide complexes and the chemical vapor deposition of gallium oxide films [J].
Valet, M ;
Hoffman, DM .
CHEMISTRY OF MATERIALS, 2001, 13 (06) :2135-2143
[58]   Bright, low voltage europium doped gallium oxide thin film electroluminescent devices [J].
Wellenius, P. ;
Suresh, A. ;
Muth, J. F. .
APPLIED PHYSICS LETTERS, 2008, 92 (02)
[59]   Growth and physical properties of Ga2O3 thin films on GaAs(001) substrate by molecular-beam epitaxy [J].
Yu, Z ;
Overgaard, CD ;
Droopad, R ;
Passlack, M ;
Abrokwah, JK .
APPLIED PHYSICS LETTERS, 2003, 82 (18) :2978-2980