Silicon-on-insulator:: materials aspects and applications

被引:33
作者
Plössl, A
Kräuter, G
机构
[1] Max Planck Inst Mikrostrukturphys, D-06120 Halle, Germany
[2] Osram Opto Semicond, D-93049 Regensburg, Germany
关键词
silicon-on-insulator; wafer direct bonding; hydrogen implantation; layer splitting; SIMOX;
D O I
10.1016/S0038-1101(99)00273-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The purpose of this contribution is to give an overview of silicon-on-insulator (SOI) technology with emphasis on the fabrication of SOI substrates and their material properties. Although the concept of SOI has been around for several decades, only recent material science advances made the fabrication of thin-him substrates possible whose material quality is comparable to bulk wafers. SIMOX wafers benefitted from lowering the oxygen dose needed for ion-beam synthesis of buried oxide layers and optimisation of the thermal annealing cycles. Through improved thinning technologies, the wafer-direct-bonding approach for the burial of thermal oxide layers became competetive for thin-film SOI. especially when complemented with the salvaging of the "sacrificial" wafer. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:775 / 782
页数:8
相关论文
共 27 条
[1]  
Assaderaghi F, 1999, ELEC SOC S, V99, P1
[2]  
AUBERTONHERVE AJ, 1998, P 8 INT S SIL MAT SC, V2, P1341
[3]   Applications of aluminium nitride films deposited by reactive sputtering to silicon-on-insulator materials [J].
Bengtsson, S ;
Bergh, M ;
Choumas, M ;
Olesen, C ;
Jeppson, KO .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (08) :4175-4181
[4]   Application of hydrogen ion beams to Silicon On Insulator material technology [J].
Bruel, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1996, 108 (03) :313-319
[5]   SILICON-ON-INSULATOR MATERIAL TECHNOLOGY [J].
BRUEL, M .
ELECTRONICS LETTERS, 1995, 31 (14) :1201-1202
[6]  
COLINGE JP, 1997, SILICON INSULATOR TE
[7]   Electron spin resonance characterization of trapping centers in Unibond(R) buried oxides [J].
Conley, JF ;
Lenahan, PM ;
Wallace, BD .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1996, 43 (06) :2635-2638
[8]   SILICON FILMS ON SAPPHIRE [J].
CRISTOLOVEANU, S .
REPORTS ON PROGRESS IN PHYSICS, 1987, 50 (03) :327-371
[9]  
En W. G., 1998, 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199), P163, DOI 10.1109/SOI.1998.723162
[10]   Physical characterization of electron trapping in Unibond® oxides [J].
Gruber, O ;
Paillet, P ;
Musseau, O ;
Marcandella, C ;
Aspar, B ;
Auberton-Herve, AJ .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1998, 45 (03) :1402-1406